CHEN, Z., HU, X., XIA, X., GAO, Y., XU, T., LO, D., & YANG, X. (2024). Exploiting library vulnerability via migration-based automated test generation. Institutional Knowledge at Singapore Management University.
Chicago Style CitationCHEN, Zirui, Xing HU, Xin XIA, Yi GAO, Tongtong XU, David LO, and Xiaohu YANG. Exploiting Library Vulnerability Via Migration-based Automated Test Generation. Institutional Knowledge at Singapore Management University, 2024.
MLA CitationCHEN, Zirui, et al. Exploiting Library Vulnerability Via Migration-based Automated Test Generation. Institutional Knowledge at Singapore Management University, 2024.
Warning: These citations may not always be 100% accurate.