Two-dimensional inverse scattering problems of small and extended scatterers

由 AGARWAL KRISHNA
出版 2011

Eigen-analysis reveals components supporting super-resolution imaging of blinking fluorophores

由 Agarwal, Krishna, Prasad, Dilip Kumar
出版 2018

Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm

由 Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar
出版 2018