Laser Anneal-Induced Effects on the NBTI Degradation of Advanced-Process 45nm high-k PMOS

by Wan Muhamad Hatta, S.F., Abd. Hadi, D., Soin, N.
Published 2011

NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations

by Hatta, S.F.W.M., Soin, N., Abd Hadi, D., Zhang, J.F.
Published 2010

NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process.

by Wan Muhamad Hatta, S.F., Soin, N., Abd Hadi, D., Zhang, J.F.
Published 2010