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3MeV-electron beam induced threshold voltage shifts and drain current degradation on ZVN3320FTA & ZVP3310FTA commercial MOSFETs

3MeV-electron beam induced threshold voltage shifts and drain current degradation on ZVN3320FTA & ZVP3310FTA commercial MOSFETs

by Abubakkar, Sheik Fareed Ookar, Hasbullah, Nurul Fadzlin, Zabah, Nor Farahidah, Abdullah, Yusof
Published 2014

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Conference or Workshop Item

2

Effects of electron radiation on commercial power MOSFET with buck converter application

Effects of electron radiation on commercial power MOSFET with buck converter application

by Abubakkar, Sheik Fareed Ookar, Za'bah, Nor Farahidah, Abdullah, Yusof, Ahmad Fauzi, Dhiyauddin, Muridan, Norasmahan, Hasbullah, Nurul Fadzlin
Published 2017

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