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Borojevic, N

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$Should the refractive index at 633 nm Be used to characterize silicon nitride films?$

Should the refractive index at 633 nm Be used to characterize silicon nitride films?

by Hameiri, Z, Borojevic, N, Mai, L, Nandakumar, N, Kim, K, Winderbaum, S
Published 2019

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