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Charles, Jean-Pierre
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Charles, Jean-Pierre
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Charles, Jean-Pierre
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DLTS and C(t) transient study of defects induced by neutron radiation in MOS structures of CCD technology
by
Ahaitouf, Aziz
,
Bakhtiar, Hazri
,
Losson, Etienne
,
Charles
,
Jean
-
Pierre
Published 2003
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