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Fu, Chunmiao
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Fu, Chunmiao
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Study on the effectiveness of reservoir length in improving electromigration in Cu/Low-k interconnects
by
Fu
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Chunmiao
Published 2011
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Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes
by
Tan, Cher Ming
,
Fu
,
Chunmiao
Published 2013
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