Low frequency noise analysis of LT-GaAs and LT-AI0.3Ga0.7 As MISFET active layers

by Rao, R.V.V.V.J., Chong, T.C., Lau, W.S., Tan, L.S., Geng, C., Lim, N.
Published 2014

Carbon nitride thin films deposited by nitrogen-ion-assisted KRF excimer ablation of graphite

by Feng, L.Y., Min, R.Z., Qiao, N.H., Feng, H.Z., Chan, D.S.H., Seng, L.T., Yin, C.S., Gamani, K., Geng, C., Kun, L.
Published 2014