Resistive RAM endurance : array-level characterization and correction techniques targeting deep learning applications

由 Grossi, Alessandro, Vianello, Elisa, Mohamed M. Sabry, Barlas, Marios, Grenouillet, Laurent, Coignus, Jean, Beigne, Edith, Wu, Tony, Le, Binh Q, Wootters, Mary K., Zambelli, Cristian, Nowak, Etienne, Mitra, Subhasish
出版 2020