Impact of Lanthanum on positive-bias temperature instability - insight from first-principles simulation

by Gu, Chen Jie, Ang, Diing Shenp
Published 2014

On the evolution of switching oxide traps in the HfO2/TiN gate stack subjected to positive- and negative-bias temperature stressing

by Gao, Yuan, Ang, Diing Shenp, Gu, Chen Jie
Published 2014