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by Mid, E.C., Mukhtar, N.M., Syed Yunus, S.H., Abdul Hadi, Dayanasari, Ruslan, Eliyana
Published 2023
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by Zakaria, A., Mid, E.C., Mohamed, M.F., Hussin, M.H.M., Shaari, A.S., Ruslan, Eliyana, Hadi, Dayanasari, Masri, M.
Published 2023
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Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET
by Hatta, Sharifah Wan M., Hussin, Hanim Yati, Soon, F.Y., Abdul Wahab, Yasmin, Abdul Hadi, Dayanasari, Soin, Norhayati, Alam, A. H.M.Zahirul, Nordin, Anis Nurashikin
Published 2017
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