3D electromigration modeling at the circuit layout level

by He, Feifei
Published 2012

Comparison of electromigration simulation in test structure and actual circuit

by He, Feifei, Tan, Cher Ming
Published 2013

Effect of IC layout on the reliability of CMOS amplifiers

by He, Feifei, Tan, Cher Ming
Published 2013

Electromigration reliability of interconnections in RF low noise amplifier circuit

by He, Feifei, Tan, Cher Ming
Published 2013

3D circuit model for 3D IC reliability study

by Tan, Cher Ming, He, Feifei
Published 2010

3D simulation-based research on the effect of interconnect structures on circuit reliability

by He, Feifei, Tan, Cher Ming
Published 2015

Degradation behavior of high power light emitting diode under high frequency switching

by Chen, S. H., Tan, G. H., Tan, Cher Ming, He, Feifei
Published 2013

Ab initio simulation of electronic and mechanical properties of aluminium for fatigue early feature investigation

by Zhang, Shuai, Tan, Cher Ming, Cheng, Shuguang, Deng, Tianqi, He, Feifei, Su, Haibin
Published 2016