Random power supply as a test vector to expose soft defects in CMOS digital circuits

by Kamisian, Izam
Published 2000

A reconfigurable low-noise amplifier using a tunable active inductor for multistandard receivers

by Kia, Hojjat Babaei, A’ain, Abu Khari, Ian, Grout, Kamisian, Izam
Published 2013

VLSI design of a split parallel two-dimensional HEVC transform

by Awab, Ainy Haziyah, Ab. Rahman, Ab. Al-Hadi, Kamisian, Izam, Rusli, Mohd. Shahrizal
Published 2021

Comprehensive analysis of gate oxide short in junctionless fin field effect transistor

by Rahman, Md. Wahidur, Alias, N. Ezaila, Hamzah, Afiq, Tan, M. L. Peng, Kamisian, Izam
Published 2022

Gate leakage logic detection for analog CMOS circuit

by Kamisian, Izam, Ibrahim, Muhamad Faisal, A'ain, Abu Khari, Lee, Yuen Tat, Tan, Terrence Huat Hin
Published 2008

The design of built in current extractor circuit for IDDQ test

by Ibrahim, Muhammad Faisal, Kamisian, Izam, A'ain, Abu Khari, Tat, Lee Yuen, Hin, Tan Terrence Huat
Published 2007

Digital detection of gate leakage for analog CMOS circuit

by Ibrahim, Muhammad Faisal, Kamisian, Izam, A'ain, Abu Khari, Lee, Yuen Tat, Terrence, Tan Huat Hin
Published 2007

A 2 Kbit memory array of mixed-VT GC-eDRAM implemented in 130nm standard CMOS technology

by Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah
Published 2021

Temperature variation operation of mixed-VT 3T GC-eDRAM for low power applications in 2Kbit memory array

by Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah
Published 2022

Temperature variation operation of mixed-V-T 3T GC-eDRAM for low power applications in 2kbit memory array

by Abdo, Hussien, Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah
Published 2022

An efficient March (5n) FSM-Based Memory Built-In Self Test (MBIST) architecture

by Nguan Kong, T. S., Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Tan, M. L. Peng, Sheikh, U. Ullah, Abdul Wahab, Yasmin
Published 2021

An efficient march (5n) FSM-based Memory Built-In Self Test (MBIST) architecture

by Nguan Kong, T. S., Alias, N. Ezaila, Hamzah, Afiq, Kamisian, Izam, Peng Tan, M.L., Sheikh, U. Ullah, Abdul Wahab, Yasmin
Published 2021