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Koh, K.A.
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Koh, K.A.
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Koh, K.A.
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1
Electromigration in aluminum/silicon/copper metallization due to the presence of a thin oxide layer
by
Koh
,
K.A
.
,
Chua, S.J.
Published 2014
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2
ON DISCRIMINATOR-DETECTED BINARY FSK IN A FADING ENVIRONMENT.
by
Tjhung, T.T.
,
Lye, K.M.
,
Koh
,
K.A
.
,
Tan, B.T.
Published 2014
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3
ON DISCRIMINATOR-DETECTED BINARY FSK IN A FADING ENVIRONMENT.
by
Tjhung, T.T.
,
Lye, K.M.
,
Koh
,
K.A
.
,
Tan, B.T.
Published 2014
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Conference or Workshop Item
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