Evaluation of the Transfer Learning Models in Wafer Defects Classification

by Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen
Published 2022

The Classification of Wafer Defects: A Support Vector Machine with Different DenseNet Transfer Learning Models Evaluation

by Ismail, Mohd Khairuddin, Lim, Shi Xuen, Mohd Azraai, Mohd Razman, Jessnor Arif, Mat Jizat, Yuen, Edmund, Jiang, Haochuan, Yap, Eng Hwa, Anwar, P. P. Abdul Majeed
Published 2023