Epitaxial film growth and characterization

by Ferguson, I.T., Thompson, A.G., Barnett, S.A., Long, F.H., Feng, Z.C.
Published 2014

Spatial characterization of doped SiC wafers by Raman spectroscopy

by Burton, J.C., Sun, L., Pophristic, M., Lukacs, S.J., Long, F.H., Feng, Z.C., Ferguson, I.T.
Published 2014