Effect of single event upset on 6T and 12T 32NM CMOS SRAMs circuit

by Yusop, Nur Syafiqah, Mahmud, Manzar, Nordin, Anis Nurashikin, Hasbullah, Nurul Fadzlin
Published 2016

Radiation characteristics and SEU rates in NEqO environment using SPENVIS

by Benkara, Souaad, Mahmud, Manzar, Ab Rahim, Rosminazuin, Hasbullah, Nurul Fadzlin, Sabri, Sharizal Fadlie
Published 2016