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Maji, D.
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Maji, D.
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Border-trap characterization in high-κ strained-Si MOSFETs
by
Maji
,
D
.
,
Duttagupta, S.P.
,
Rao, V.R.
,
Yeo, C.C.
,
Cho, B.-J.
Published 2014
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