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Detecting Resistive-Opens in RRAM using Programmable DfT Scheme

Detecting Resistive-Opens in RRAM using Programmable DfT Scheme

by Nor Zaidi , Haron, Norsuhaidah , Arshad, Sukreen Hana , Herman
Published 2013

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Conference or Workshop Item

2

A New Test Scheme for Process Variation-Induced Faults in Resistive RAMs

A New Test Scheme for Process Variation-Induced Faults in Resistive RAMs

by Haron, Nor Zaidi, Fauziyah , Salehuddin, Norsuhaidah , Arshad, Zahriladha , Zakaria
Published 2013

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