Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films

by Tian, Siyu Isaac Parker, Ren, Zekun, Venkataraj, Selvaraj, Cheng, Yuanhang, Bash, Daniil, Oviedo, Felipe, Jayavelu, Senthilnath, Chellappan, Vijila, Lim, Yee-Fun, Aberle, Armin Gerhard, MacLeod, Benjamin P, Parlane, Fraser GL, Berlinguette, Curtis P, Li, Qianxiao, Buonassisi, Tonio, Liu, Zhe
Published 2023