Nanoscale characterization of metal/dielectric/semiconductor interfaces using ballistic electron emission microscopy

by Qin, Hailang
Published 2012

Effect of surface contamination on electron tunneling in the high bias range

by Qin, Hailang, Goh, Johnson Kuan Eng, Bosman, Michel, Li, Xiang, Pey, Kin Leong, Troadec, Cedric
Published 2013

Barrier height determination of Au/Oxidized GaAs/n-GaAs using ballistic electron emission spectroscopy

by Bosman, Michel, Ong, Beng Sheng, Chiam, Sing Yang, Pey, Kin Leong, Qin, Hailang, Liu, Zhiqiang, Troadec, Cedric, Goh, Johnson Kuan Eng
Published 2013