Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometer

by Taijing, Lu, Ng, S.C.
Published 2014

Effect of surface structures upon ultrathin film interference fringes

by Taijing, Lu, Ogawa, Tomoya, Toyoda, Koichi, Wang, Zhenguo
Published 2014

Vacuum pump coaxial probe system for measurement of dielectric properties of materials with smooth surfaces

by Ding, X.Z., Taijing, Lu, Ong, C.K., Tan, B.T.G.
Published 2014