MUT: Human-in-the-loop unit test migration

由 GAO, Yi, HU, Xing, XU, Tongtong, XIA, Xin, LO, David, YANG, Xiaohu
出版 2024

Exploiting library vulnerability via migration-based automated test generation

由 CHEN, Zirui, HU, Xing, XIA, Xin, GAO, Yi, XU, Tongtong, LO, David, YANG, Xiaohu
出版 2024

An empirical study of automatic program repair techniques for injection vulnerabilities

由 ZHU, Tingwei, XU, Tongtong, LIU, Kui, ZHOU, Jiayuan, HU, Xing, XIA, Xin, ZHANG, Tian, David LO
出版 2024