SYNTHESIS AND CHARACTERIZATION NICKEL OXIDE THIN FILM PREPARED BY SELF ASSEMBLED MONOLAYERS (SAMS) METHOD
Microstructure and optical characteristic of nickel oxide thin film deposited by self assembled monolayers (SAMs) method have been studied. Nickel oxide thin films were prepared on glass substrates with parameter variation which is involved immersing time (12 and 24 hours) and chitosan (with and wit...
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| Format: | Final Project |
| Language: | Indonesia |
| Online Access: | https://digilib.itb.ac.id/gdl/view/15136 |
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| Institution: | Institut Teknologi Bandung |
| Language: | Indonesia |
| Summary: | Microstructure and optical characteristic of nickel oxide thin film deposited by self assembled monolayers (SAMs) method have been studied. Nickel oxide thin films were prepared on glass substrates with parameter variation which is involved immersing time (12 and 24 hours) and chitosan (with and without chitosan). The microstructure and optical properties was investigated by x-ray diffraction, scanning electron microscope, and UV-Visible spectroscopy. The effect of immersing time for 12 and 24 hours has been investigated. Optical transmittance decreased when the immersing time was longer because obtained thin films were thicker. Based on XRD data, thin films prepared by SAMs had the structure of NiO which had three strongest peaks at (111), (200), and (220). Surface morphology shows that thin films growth mode are mixed growth (Stranski – Krastanov). UV-Visible spectroscopy results that chitosan made the optical transmittance decreased, with optical transmittance maximum at 48,1%. Optical transmittance decreased by increasing of the immersing time. Band gap optic results at 3,75 eV – 3,9 eV. |
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