CHARACTERIZATION OPTICAL PROPERTIES AND STRUCTURE OF NICKEL-DOPED ZINC OXIDE (NZO) THIN FILM PREPARED BY SELF-ASSEMBLED MONOLAYERS (SAMS) METHOD FOR TCO-SOLAR CELL APPLICATION

• Main Author: INDRA MULYANA (NIM : 13705026); Pembimbing : Dr. Ir. Bambang Sunendar
• Format: Final Project
• Language: Indonesia
• Online Access: https://digilib.itb.ac.id/gdl/view/16056
• Institution: Institut Teknologi Bandung

An optical and structural characteristic of zinc oxide thin films doped by nickel (nickel-doped zinc oxide-NZO) was deposited by self assembled monolayers (SAMs). Nickel-doped Zinc Oxide (NZO) thin film materials are prepared by Self Assembled Monolayers (SAMS) sol-gel method. The TCO materials preparations are varied in three variables, which are dopant molar ratio, time deposition and annealing temperature. The dopant molar ratios are 1%, 2%, and 3%. The calcination temperatures are 400oC and 500 oC. The NZO transmittance measured by Ultraviolet-Visible-Near Infra Red (UV-Vis-NIR) Spectroscopy method. The NZO crystal lattice and its direction preference analyzed by X-Ray Diffraction.. The microstructure analyzed using Scanning Electron Microscope (SEM) method done on the surface and the cross-section of the NZO materials. The maximum optical transmittance values of the 3% mol Ni doped NZO thin films were more than 82.64% in the visible range. The optical band-gap measured is ranged 3.01 and 3.02 eV. Based on XRD result, there is thin film NZO has monocrystalline structure with crystal orientation of (002). The morphology NZO thin films were looked mixed growth and flower-like structure with thickness that was measured between 113 nm and 872 nm.