CHARACTERIZATION OF OPTICAL PROPERTIES OF HEPTAZETHRENE TRIISOPROPYLSILYLETHYLENYL (HZ-TIPSE) MATERIALS

• Main Author: MIQDAD ARROMY (NIM : 10212063), MUHAMMAD
• Format: Final Project
• Language: Indonesia
• Online Access: https://digilib.itb.ac.id/gdl/view/23290
• Institution: Institut Teknologi Bandung

Hz-Tipse has advantages in the presence of two distinct resonance structures (a closed-shell quinoidal form and an open-shell biradical form) that can lead to significant biradical contributions to the electronic configuration of its ground state. The characterization of optical properties in this material is still very limited. Hz-Tipse is generated through a synthetic approach by accessing extended zethrenes (i.e triisopropylsilylethynylene) to block heptazethrene so that it is stable. In Hz-Tipse, a characterization technique using ellipsometric spectroscopy (SE) was used to determine the optical properties of the material. Then, fourier transform infra-red (FTIR) and scanning electron microscope (SEM) were also performed to support data analysis. Measurements of SE in Hz-Tipse thin film were performed in several concentrations of 5 mM, 15 mM, and 34 mM. FTIR and SEM results show the formation of Hz-Tipse layer above SiO2/Si. Furthermore, the SE characterization yields ε1 and ε2 values in the Hz-Tipse thin layer to determine other optical parameters. Finally, the ε2 curve shows a phenomenon indicating an inter-band transition along the photon energy indicating that the Hz-Tipse material is conductive.