AVO PHENOMENA IN THIN LAYER RESERVOIR

• Main Author: REZA MUTAQIN (NIM : 10211055), MUHAMMAD
• Format: Final Project
• Language: Indonesia
• Online Access: https://digilib.itb.ac.id/gdl/view/23317
• Institution: Institut Teknologi Bandung

<p align="justify">Amplitude Versus Offset is method based on anomaly of increasing amplitude variation with offset. Study of AVO phenomena in thin layer reservoir is important since many geologic conditions are not thick enough when compared to the seismic wavelength. Therefore, study of thin layer is also essential thing, especially to increase reserve estimation as well as production, since many of reservoirs are naturally thin instead of thick layer. Thin layer reservoir means the thickness of reservoir is about or less than quarter of wavelength. Thin layer reservoir causes interference between reflected wave of top reservoir and reflected wave of bottom reservoir. This study will compare the result of Liu-Schmitt (2003) and Nurhandoko (2012) modelling for thin layer reservoir on field data. Both approximation from Liu-Schmitt and Nurhandoko represent the AVO responses for thin layer reservoir and thick layer reservoir related to reflection coefficient. Differences were obtained due to the influence of wave-S are calculated on an elastic medium.<p align="justify">