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A temperature-dependent electrical resistivity measurement system based on voltage-to-current (I-V) curve of a material has been created using a LabVIEW interface. It has been designed to facilitate and accelerate processes for temperature control and voltage and current data acquisition using a sem...
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id-itb.:254442018-01-02T10:24:25Z#TITLE_ALTERNATIVE# KISTILENSA (NIM : 10210072), AMANDA Indonesia Final Project INSTITUT TEKNOLOGI BANDUNG https://digilib.itb.ac.id/gdl/view/25444 A temperature-dependent electrical resistivity measurement system based on voltage-to-current (I-V) curve of a material has been created using a LabVIEW interface. It has been designed to facilitate and accelerate processes for temperature control and voltage and current data acquisition using a semi-automatic system which utilizes the state machine programming architecture and running <br /> <br /> average algorithm. Resistance of a material is acquired through its I-V curve using Ohm's Law, which formulates resistance as the gradient of a line obtained from a linear regression on I-V data points within the ohmic conduction region of the studied material. This measurement system can be more accurate than conventional measurement from a singular I-V measurement because resistance is acquired through several data measurements in the ohmic region. In this project, resistivity measurement using the I-V curve is performed with a variation in temperature within the range of 290 K to 50 K for several types of materials, <br /> <br /> namely semiconductor sample Bi1,5Pb0,5Ca2Co2O8 and superconductor sample Bi2Sr2CaCu2O8+x. Experiment results for Bi1,5Pb0,5Ca2Co2O8 produced a linear I-V curve, showing that measurement has been performed in the ohmic region and producing an appropriate R-T curve. Bi-2212 results showcased a decrease in resistivity towards temperature but critical temperature at 90 K was not observed, leading to the conclusion that the Bi-2212 sample is no longer superconducting, confirmed through a SEM-EDS analysis and <br /> <br /> measurement of magnetization towards temperature. Nevertheless, results align with conventional measurement and consistency from various modes of measurement demonstrate that the interface serves its function within the temeprature-dependent resistivity measurement system. text |
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A temperature-dependent electrical resistivity measurement system based on voltage-to-current (I-V) curve of a material has been created using a LabVIEW interface. It has been designed to facilitate and accelerate processes for temperature control and voltage and current data acquisition using a semi-automatic system which utilizes the state machine programming architecture and running <br />
<br />
average algorithm. Resistance of a material is acquired through its I-V curve using Ohm's Law, which formulates resistance as the gradient of a line obtained from a linear regression on I-V data points within the ohmic conduction region of the studied material. This measurement system can be more accurate than conventional measurement from a singular I-V measurement because resistance is acquired through several data measurements in the ohmic region. In this project, resistivity measurement using the I-V curve is performed with a variation in temperature within the range of 290 K to 50 K for several types of materials, <br />
<br />
namely semiconductor sample Bi1,5Pb0,5Ca2Co2O8 and superconductor sample Bi2Sr2CaCu2O8+x. Experiment results for Bi1,5Pb0,5Ca2Co2O8 produced a linear I-V curve, showing that measurement has been performed in the ohmic region and producing an appropriate R-T curve. Bi-2212 results showcased a decrease in resistivity towards temperature but critical temperature at 90 K was not observed, leading to the conclusion that the Bi-2212 sample is no longer superconducting, confirmed through a SEM-EDS analysis and <br />
<br />
measurement of magnetization towards temperature. Nevertheless, results align with conventional measurement and consistency from various modes of measurement demonstrate that the interface serves its function within the temeprature-dependent resistivity measurement system. |
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Final Project |
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KISTILENSA (NIM : 10210072), AMANDA |
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KISTILENSA (NIM : 10210072), AMANDA #TITLE_ALTERNATIVE# |
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KISTILENSA (NIM : 10210072), AMANDA |
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KISTILENSA (NIM : 10210072), AMANDA |
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https://digilib.itb.ac.id/gdl/view/25444 |
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1822020695569203200 |