FABRICATION AND CHARACTERIZATION OF NANOSTRUCTURED ZNS:CU LED

Research related to modification of the Light Emitting Diodes (LED) layer is very interesting to be developed because of the existence of data transfer technology using visible light or Visible Light Communication (VLC). Human needs are increasingly demanding data transfer technology that has inc...

Full description

Saved in:
Bibliographic Details
Main Author: Ghifari Nurlis, Aulia
Format: Final Project
Language:Indonesia
Subjects:
Online Access:https://digilib.itb.ac.id/gdl/view/55277
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Institut Teknologi Bandung
Language: Indonesia
Description
Summary:Research related to modification of the Light Emitting Diodes (LED) layer is very interesting to be developed because of the existence of data transfer technology using visible light or Visible Light Communication (VLC). Human needs are increasingly demanding data transfer technology that has increased performance both in terms of transfer speed and data accuracy. The role of LEDs as the main transmission medium of the VLC system is very important to be developed. The focus of this research is to see the effect of surface modification of the nanostructures on the LED material, namely zinc sulfide doped with copper metal (ZnS:Cu) on the performance in the form of intensity, wavelength, and spatial distribution of the light beam produced by the LED. The method used to manufacture nanopattern on a semiconductor die LED is the nanoimprint lithography method. Prints for nanoimprint lithography are made using Polydimethylsiloxane (PDMS) by printing nanopatterns on the surface of DVD and Blu-ray on PDMS. The characterization of nanoscale patterns on the Polycarbonate DVD and BD layers was carried out using a Scanning Electron Microscope (SEM). Then, after the imprinting process, the PDMS was characterized again using SEM. After the imprint lithography process, SEM characterization was also carried out to ensure that the nano patterns were printed properly. The intensity of light emission will be measured using a luxmeter at the variation of the emission angle. In addition, the shift in the wavelength of the beam is measured using a spectrometer.