FABRICATION AND CHARACTERIZATION OF NANOSTRUCTURED ZNS:CU LED
Research related to modification of the Light Emitting Diodes (LED) layer is very interesting to be developed because of the existence of data transfer technology using visible light or Visible Light Communication (VLC). Human needs are increasingly demanding data transfer technology that has inc...
Saved in:
Main Author: | |
---|---|
Format: | Final Project |
Language: | Indonesia |
Subjects: | |
Online Access: | https://digilib.itb.ac.id/gdl/view/55277 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Institut Teknologi Bandung |
Language: | Indonesia |
Summary: | Research related to modification of the Light Emitting Diodes (LED) layer is very
interesting to be developed because of the existence of data transfer technology
using visible light or Visible Light Communication (VLC). Human needs are
increasingly demanding data transfer technology that has increased performance
both in terms of transfer speed and data accuracy. The role of LEDs as the main
transmission medium of the VLC system is very important to be developed. The
focus of this research is to see the effect of surface modification of the
nanostructures on the LED material, namely zinc sulfide doped with copper metal
(ZnS:Cu) on the performance in the form of intensity, wavelength, and spatial
distribution of the light beam produced by the LED. The method used to
manufacture nanopattern on a semiconductor die LED is the nanoimprint
lithography method. Prints for nanoimprint lithography are made using
Polydimethylsiloxane (PDMS) by printing nanopatterns on the surface of DVD and
Blu-ray on PDMS. The characterization of nanoscale patterns on the
Polycarbonate DVD and BD layers was carried out using a Scanning Electron
Microscope (SEM). Then, after the imprinting process, the PDMS was
characterized again using SEM. After the imprint lithography process, SEM
characterization was also carried out to ensure that the nano patterns were printed
properly. The intensity of light emission will be measured using a luxmeter at the
variation of the emission angle. In addition, the shift in the wavelength of the beam
is measured using a spectrometer. |
---|