Characteristics of Fast ion beam in Neon and Argon filled plasma focus correlated with Lee Model Code

• Main Authors: Damideh, V., Chin, O.H., Saw, S. H., Lee, P. C. K., *Lee, S.
• Format: Article
• Published: Elsevier 2019
• Subjects: QC Physics; T Technology (General)
• Online Access: http://eprints.intimal.edu.my/1313/; https://doi.org/10.1016/j.vacuum.2019.108916
• Institution: INTI International University

In this paper, results of time-of-flight measurements of fast ion beam generated and accelerated in the final pinch phase of a 2 kJ dense plasma focus device at 12 kV in Neon and Argon are presented. The measurements were made using a 50 Ω F Cup and these results were correlated with Lee Model Code...