SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield

SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots with Good Yield

The six-phase Lee model code was developed to compute the anomalous resistance phase (RAN) following the pinch phase in a plasma focus (PF) discharge. One important method to check such modeling is to look at the soft X-ray (SXR) emission time profile and to correlate this to the PF dynamics. A...

Full description

Saved in:
Bibliographic Details
Main Authors: Saw, Sor Heoh, Rawat, Rajdeep S., Lee, Paul, Talebitaher, Alireza, Abdou, Ali. E, Chong, Perk Lin, Roy, Federico, Ali, Jalil, Lee, Sing
Format: Article
Language:English
Published: IEEE 2013
Subjects:
QC Physics
Online Access:http://eprints.intimal.edu.my/176/1/SXR%20measurements%20in%20INTI%20PF%20operated%20in%20neon%20to%20identify%20typical%20%28normal%20n%29%20profile%20for%20shots%20with%20good%20yield.pdf
http://eprints.intimal.edu.my/176/
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: INTI International University
Language: English

Internet

http://eprints.intimal.edu.my/176/1/SXR%20measurements%20in%20INTI%20PF%20operated%20in%20neon%20to%20identify%20typical%20%28normal%20n%29%20profile%20for%20shots%20with%20good%20yield.pdf
http://eprints.intimal.edu.my/176/

Similar Items