Numerical experiments on neutron yield and soft x-ray study of a ∼100 kJ plasma focus using the current profile fitting technique
Numerical experiments using the Lee model were performed to study the neutron yield and soft x-ray emission from the IR-MPF-100 plasma focus using the current fitting technique. The mass sweeping factor and the current factor for the axial and radial phase were used to represent the imperfections...
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Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2014
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Subjects: | |
Online Access: | http://eprints.intimal.edu.my/343/1/numerical-experiments-on-neutron-yield-and-soft-x-ray-study-of-a-100-kj-plasma-focus-using-the-current-profile-fitting-technique.pdf http://eprints.intimal.edu.my/343/ |
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Institution: | INTI International University |
Language: | English |
Summary: | Numerical experiments using the Lee model were performed to study the neutron yield and
soft x-ray emission from the IR-MPF-100 plasma focus using the current fitting technique.
The mass sweeping factor and the current factor for the axial and radial phase were used to
represent the imperfections encountered in experiments. All gross properties including the
yields were realistically simulated once the computed and measured current profiles were well
fitted. The computed neutron yield Yn was in agreement with the experimentally measured Yn
at 20 kV (E0 ∼ 30 kJ) charging voltage. The optimum computed neutron yield of
Yn = 1.238 × 109 neutrons per shot was obtained at optimum physics parameters of the
plasma focus operated with deuterium gas. It was also observed that no soft x-rays were
emitted from the IR-MPF-100 plasma focus operated with argon gas due to the absence of
helium-like and hydrogen-like ions at a low plasma temperature (∼0.094 keV) and axial speed
(8.12 cmμs−1). However, the soft x-ray yield can be achieved by increasing the charging
voltage, using a higher ratio of outer anode radius to inner anode radius c or shorter anode
length z0, or using neon as the operating gas. |
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