Advancing high-volume GaN manufacturing: precision simulation of electrical and geometrical deviations through current spreading

• Main Authors: Ahmad Fajri, Faris Azim, Kopp, Fabian, Ahmad Noorden, Ahmad Fakhrurrazi, Iglesias, Alvaro Gomez
• Format: Article
• Language: English; English; English
• Published: IOP Publishing 2024
• Subjects: QC Physics
• Online Access: http://irep.iium.edu.my/117266/7/117266_Advancing%20high-volume%20GaN%20manufacturing.pdf; http://irep.iium.edu.my/117266/8/117266_Advancing%20high-volume%20GaN%20manufacturing_Scopus.pdf; http://irep.iium.edu.my/117266/9/117266_Advancing%20high-volume%20GaN%20manufacturing_WoS.pdf; http://irep.iium.edu.my/117266/; https://iopscience.iop.org/article/10.1088/2631-8695/ad853a
• Institution: Universiti Islam Antarabangsa Malaysia

Manufacturing process deviations pose significant challenges in GaN manufacturing especially when modern technologies demand extreme chip densities. More than a thousand of each of three distinct GaN-based flip-chips were manufactured where the standard deviations of the measured voltages ranged fro...