Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT

A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arri...

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Main Authors: Tian, G.Y., Sophian, Ali, Taylor, D., Rudlin, J.
Format: Article
Language:English
Published: Institute of Electrical Engineers 2005
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Online Access:http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf
http://irep.iium.edu.my/47012/
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Institution: Universiti Islam Antarabangsa Malaysia
Language: English
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spelling my.iium.irep.470122016-01-14T08:07:10Z http://irep.iium.edu.my/47012/ Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT Tian, G.Y. Sophian, Ali Taylor, D. Rudlin, J. TK Electrical engineering. Electronics Nuclear engineering A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arrival time from pulsed eddy current signals, a two-step framework for defect classification and quantification is proposed by using adopted features from principal component analysis and wavelet analysis. For defect classification and quantification, different features have been extracted from the pulsed eddy current signals. Experimental tests have been undertaken for ferrous and non-ferrous metal samples with manufactured defects. The results have illustrated the new approach has better performance than the current approaches for surface and sub-surface defect classification. The defect quantification performance, which is difficult by using current approaches, is impressive. Institute of Electrical Engineers 2005-07 Article REM application/pdf en http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf Tian, G.Y. and Sophian, Ali and Taylor, D. and Rudlin, J. (2005) Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT. Science, Measurement and Technology, IEE Proceedings -, 152 (4). pp. 141-148. ISSN 1350-234
institution Universiti Islam Antarabangsa Malaysia
building IIUM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider International Islamic University Malaysia
content_source IIUM Repository (IREP)
url_provider http://irep.iium.edu.my/
language English
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Tian, G.Y.
Sophian, Ali
Taylor, D.
Rudlin, J.
Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
description A new approach for defect classification and quantification by using pulsed eddy current sensors and integration of principal component analysis and wavelet transform for feature based signal interpretation is presented. After reviewing the limitation of current parameters of peak value and its arrival time from pulsed eddy current signals, a two-step framework for defect classification and quantification is proposed by using adopted features from principal component analysis and wavelet analysis. For defect classification and quantification, different features have been extracted from the pulsed eddy current signals. Experimental tests have been undertaken for ferrous and non-ferrous metal samples with manufactured defects. The results have illustrated the new approach has better performance than the current approaches for surface and sub-surface defect classification. The defect quantification performance, which is difficult by using current approaches, is impressive.
format Article
author Tian, G.Y.
Sophian, Ali
Taylor, D.
Rudlin, J.
author_facet Tian, G.Y.
Sophian, Ali
Taylor, D.
Rudlin, J.
author_sort Tian, G.Y.
title Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
title_short Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
title_full Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
title_fullStr Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
title_full_unstemmed Wavelet-based PCA defect classification and quantification for pulsed eddy current NDT
title_sort wavelet-based pca defect classification and quantification for pulsed eddy current ndt
publisher Institute of Electrical Engineers
publishDate 2005
url http://irep.iium.edu.my/47012/1/iet_Wavelet-based_PCA_defect_classification.pdf
http://irep.iium.edu.my/47012/
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