Spiral-scan atomic force microscopy: a constant linear velocity approach
This paper describes an alternative method to the widely-used raster-scan technique for Atomic Force Microscopy (AFM). In this method, the sample is scanned in a spiral pattern instead of the well established raster trajectory. A spiral pattern is produced by applying cosine and sine signals with sl...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
2010
|
| Subjects: | |
| Online Access: | http://irep.iium.edu.my/5303/4/Spiral-Scan_Atomic_Force_Microscopy_A_Constant_Linear_Velocity_Approach.pdf http://irep.iium.edu.my/5303/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Universiti Islam Antarabangsa Malaysia |
| Language: | English |