The use of SEM to investigate the effect of an electron beam on the optically-visible flashover treeing of MgO ceramic

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of insulators under electron bombardment. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an insulator surface simultaneously. The di...

Full description

Saved in:
Bibliographic Details
Main Authors: Sutjipto, Agus Geter Edy, Takata, Masasuke
Format: Article
Language:English
Published: Springer Science+Business Media 2007
Subjects:
Online Access:http://irep.iium.edu.my/8676/1/AGUS_-_Journal_of_Materials_Science_2007.pdf
http://irep.iium.edu.my/8676/
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Islam Antarabangsa Malaysia
Language: English