An SEM flashover: technique to characterize wide band gap insulators

This paper introduces the use of a scanning electron microscope (SEM) to evaluate the insulation property of wide band gap insulators. An SEM may be used not only to observe a surface image but also to provide a fine electron beam for charging an uncoated insulator surface at once. The charging can...

Full description

Saved in:
Bibliographic Details
Main Authors: Sutjipto, Agus Geter Edy, Muhida, Riza, Takata, Masasuke
Format: Conference or Workshop Item
Language:English
Published: 2006
Subjects:
Online Access:http://irep.iium.edu.my/9423/1/An_SEM_Flashover_-_IEEE_2006.pdf
http://irep.iium.edu.my/9423/
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Universiti Islam Antarabangsa Malaysia
Language: English