Development of a robust multi-scale featured local binary pattern for improved facial expression recognition
Compelling facial expression recognition (FER) processes have been utilized in very successful fields like computer vision, robotics, artificial intelligence, and dynamic texture recognition. However, the FER’s critical problem with traditional local binary pattern (LBP) is the loss of neighboring pix...
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Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI
2020
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Subjects: | |
Online Access: | http://eprints.sunway.edu.my/1658/1/Mayeen%20Development%20of%20a%20robust.pdf http://eprints.sunway.edu.my/1658/ http://doi.org/10.3390/s20185391 https://doi.org/10.3390/s20185391 |
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Institution: | Sunway University |
Language: | English |
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