Development of a robust multi-scale featured local binary pattern for improved facial expression recognition

Compelling facial expression recognition (FER) processes have been utilized in very successful fields like computer vision, robotics, artificial intelligence, and dynamic texture recognition. However, the FER’s critical problem with traditional local binary pattern (LBP) is the loss of neighboring pix...

Full description

Saved in:
Bibliographic Details
Main Authors: Suraiya, Y., Pathan, R. K., Biswas, M., Khandaker, Mayeen Uddin *, Faruque, M. R. I.
Format: Article
Language:English
Published: MDPI 2020
Subjects:
Online Access:http://eprints.sunway.edu.my/1658/1/Mayeen%20Development%20of%20a%20robust.pdf
http://eprints.sunway.edu.my/1658/
http://doi.org/10.3390/s20185391
https://doi.org/10.3390/s20185391
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Sunway University
Language: English
Be the first to leave a comment!
You must be logged in first