Design and analysis of soft error rate in FET/CNTFET based radiation hardened SRAM cell

• Main Authors: Muthu, Bharathi Raj, Pushpa, Ewins Pon, Dhandapani, Vaithiyanathan, Jayaraman, Kamala, Vasanthakumar, Hemalatha, Oh, Won-Chun, Sagadevan, Suresh
• Format: Article
• Published: MDPI 2022
• Subjects: QD Chemistry; TA Engineering (General). Civil engineering (General)
• Online Access: http://eprints.um.edu.my/33576/
• Institution: Universiti Malaya

Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems. This work proposes a novel Carbon nanotube field-effect tran...