Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses

In this paper, we present results from the measurements of the optical Kerr nonlinearity of indium tin oxide (ITO) thin films of different thicknesses using the femtosecond (fs) Z-scan technique. ITO thin films were prepared by radio frequency magnetron sputtering on a glass substrate at room temper...

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Main Authors: Samad, Fatma Abdel, Mahmoud, Alaa, Abdel-Wahab, M. Sh, Tawfik, Wael Z., Zakaria, Rozalina, Soma, Venugopal Rao, Mohamed, Tarek
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Published: Optica Publishing Group 2022
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Online Access:http://eprints.um.edu.my/42851/
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spelling my.um.eprints.428512023-10-05T06:50:44Z http://eprints.um.edu.my/42851/ Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses Samad, Fatma Abdel Mahmoud, Alaa Abdel-Wahab, M. Sh Tawfik, Wael Z. Zakaria, Rozalina Soma, Venugopal Rao Mohamed, Tarek Q Science (General) QC Physics T Technology (General) In this paper, we present results from the measurements of the optical Kerr nonlinearity of indium tin oxide (ITO) thin films of different thicknesses using the femtosecond (fs) Z-scan technique. ITO thin films were prepared by radio frequency magnetron sputtering on a glass substrate at room temperature. The coated ITO thin films were subsequently characterized by UV-visible absorption spectroscopy, x-ray diffraction, and scanning electron microscopy. Using similar to 100 fs pulses at 80 MHz repetition rate, the optical Kerr nonlinearity in ITO with different thicknesses was investigated at different excitation wavelengths and incident pulse energies. The optical Kerr nonlinearity was found to be dependent on excitation wavelength, incident power, and ITO thickness, with a maximum value of similar to 9 x 10(-12) cm(2)/W at a wavelength of 820 nm, power of 1 W, and 170 nm ITO thickness. These results suggest that Kerr nonlinearity in ITO can be tailored by varying the film thickness, which would be ideal for ultrafast all-optical switching in future optoelectronic devices. (C) 2022 Optica Publishing Group Optica Publishing Group 2022-05 Article PeerReviewed Samad, Fatma Abdel and Mahmoud, Alaa and Abdel-Wahab, M. Sh and Tawfik, Wael Z. and Zakaria, Rozalina and Soma, Venugopal Rao and Mohamed, Tarek (2022) Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses. Journal of the optical society of america b-optical physics, 39 (5). pp. 1388-1399. ISSN 07403224, DOI https://doi.org/10.1364/JOSAB.455414 <https://doi.org/10.1364/JOSAB.455414>. 10.1364/JOSAB.455414
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic Q Science (General)
QC Physics
T Technology (General)
spellingShingle Q Science (General)
QC Physics
T Technology (General)
Samad, Fatma Abdel
Mahmoud, Alaa
Abdel-Wahab, M. Sh
Tawfik, Wael Z.
Zakaria, Rozalina
Soma, Venugopal Rao
Mohamed, Tarek
Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
description In this paper, we present results from the measurements of the optical Kerr nonlinearity of indium tin oxide (ITO) thin films of different thicknesses using the femtosecond (fs) Z-scan technique. ITO thin films were prepared by radio frequency magnetron sputtering on a glass substrate at room temperature. The coated ITO thin films were subsequently characterized by UV-visible absorption spectroscopy, x-ray diffraction, and scanning electron microscopy. Using similar to 100 fs pulses at 80 MHz repetition rate, the optical Kerr nonlinearity in ITO with different thicknesses was investigated at different excitation wavelengths and incident pulse energies. The optical Kerr nonlinearity was found to be dependent on excitation wavelength, incident power, and ITO thickness, with a maximum value of similar to 9 x 10(-12) cm(2)/W at a wavelength of 820 nm, power of 1 W, and 170 nm ITO thickness. These results suggest that Kerr nonlinearity in ITO can be tailored by varying the film thickness, which would be ideal for ultrafast all-optical switching in future optoelectronic devices. (C) 2022 Optica Publishing Group
format Article
author Samad, Fatma Abdel
Mahmoud, Alaa
Abdel-Wahab, M. Sh
Tawfik, Wael Z.
Zakaria, Rozalina
Soma, Venugopal Rao
Mohamed, Tarek
author_facet Samad, Fatma Abdel
Mahmoud, Alaa
Abdel-Wahab, M. Sh
Tawfik, Wael Z.
Zakaria, Rozalina
Soma, Venugopal Rao
Mohamed, Tarek
author_sort Samad, Fatma Abdel
title Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
title_short Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
title_full Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
title_fullStr Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
title_full_unstemmed Investigating the influence of ITO thin film thickness on the optical Kerr nonlinearity using ultrashort laser pulses
title_sort investigating the influence of ito thin film thickness on the optical kerr nonlinearity using ultrashort laser pulses
publisher Optica Publishing Group
publishDate 2022
url http://eprints.um.edu.my/42851/
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