Enhanced probabilistic neural network with data imputation capabilities for machine-fault slassification

• Main Authors: Chang, R.K.Y., Loo, Chu Kiong, Rao, M.V.C.
• Format: Article
• Published: Springer Verlag (Germany) 2009
• Subjects: T Technology (General)
• Online Access: http://eprints.um.edu.my/5159/; http://download.springer.com/static/pdf/595/art%253A10.1007%252Fs00521-008-0215-1.pdf?auth66=1352708360_fa50f6e8bd3ed4f29308866ca10becc5&ext=.pdf
• Institution: Universiti Malaya

This paper presents the expectation-maximization (EM) variant of probabilistic neural network (PNN) as a step toward creating an autonomous and deterministic PNN. In the real world, faulty reading sensors can happen and will create input vectors with missing features yet they should not be discarded...