Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films
In this investigation, TiO 2/Ag/TiO 2 multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO 2 were deposited and characterized. All the films...
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2009
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my.um.eprints.67902020-12-14T05:13:05Z http://eprints.um.edu.my/6790/ Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films Hasan, M.M. Haseeb, A.S. Md. Abdul Saidur, Rahman Masjuki, Haji Hassan Johan, Mohd Rafie TA Engineering (General). Civil engineering (General) TJ Mechanical engineering and machinery In this investigation, TiO 2/Ag/TiO 2 multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO 2 were deposited and characterized. All the films were prepared at a moderately high pressure at room temperature. It was found that single layer of TiO 2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80 and higher refractive index of 2.31 at a wavelength of 550 nm. The indirect optical band gap of the TiO 2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra-red) light. Finally, the multilayers have been deposited and characterized by X-ray diffraction, UV-visible-IR spectrophotometry, scanning electron microscopy and profilometry. American Institute of Physics 2009 Article PeerReviewed Hasan, M.M. and Haseeb, A.S. Md. Abdul and Saidur, Rahman and Masjuki, Haji Hassan and Johan, Mohd Rafie (2009) Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films. AIP Conference Proceedings, 1136 (1). pp. 229-233. ISSN 0094-243X https://doi.org/10.1063/1.3160137 |
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TA Engineering (General). Civil engineering (General) TJ Mechanical engineering and machinery Hasan, M.M. Haseeb, A.S. Md. Abdul Saidur, Rahman Masjuki, Haji Hassan Johan, Mohd Rafie Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
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In this investigation, TiO 2/Ag/TiO 2 multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO 2 were deposited and characterized. All the films were prepared at a moderately high pressure at room temperature. It was found that single layer of TiO 2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80 and higher refractive index of 2.31 at a wavelength of 550 nm. The indirect optical band gap of the TiO 2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra-red) light. Finally, the multilayers have been deposited and characterized by X-ray diffraction, UV-visible-IR spectrophotometry, scanning electron microscopy and profilometry. |
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Article |
author |
Hasan, M.M. Haseeb, A.S. Md. Abdul Saidur, Rahman Masjuki, Haji Hassan Johan, Mohd Rafie |
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Hasan, M.M. Haseeb, A.S. Md. Abdul Saidur, Rahman Masjuki, Haji Hassan Johan, Mohd Rafie |
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Hasan, M.M. |
title |
Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
title_short |
Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
title_full |
Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
title_fullStr |
Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
title_full_unstemmed |
Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films |
title_sort |
structural, optical and morphological properties of tio2/ag/tio2 multilayer films |
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American Institute of Physics |
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2009 |
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http://eprints.um.edu.my/6790/ https://doi.org/10.1063/1.3160137 |
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