Evaluation of the Transfer Learning Models in Wafer Defects Classification

• المؤلفون الرئيسيون: Jessnor Arif, Mat Jizat, Anwar, P. P. Abdul Majeed, Ahmad Fakhri, Ab. Nasir, Zahari, Taha, Yuen, Edmund, Lim, Shi Xuen
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: Springer Nature 2022
• الموضوعات: TJ Mechanical engineering and machinery
• الوصول للمادة أونلاين: http://umpir.ump.edu.my/id/eprint/36763/1/Evaluation%20of%20the%20Transfer%20Learning%20Models%20in%20Wafer%20Defects%20Classification%20%281%29.pdf; http://umpir.ump.edu.my/id/eprint/36763/; https://doi.org/10.1007/978-981-33-4597-3_78
• المؤسسة: Universiti Malaysia Pahang Al-Sultan Abdullah

In a semiconductor industry, wafer defect detection has becoming ubiquitous. Various machine learning algorithms had been adopted to be the “brain” behind the machine for reliable, fast defect detection. Transfer Learning is one of the common methods. Various algorithms under Transfer Learning had b...