Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films

Influence of new technique of ‘oil thermal annealing (OTA)’ on the nanostructured ITO coated films which improve adhesion strength, electrical conductivity and optical properties (transmittance) is revealed. The X-ray diffraction measurement (XRD) used to investigate the properties of nano structure...

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Main Authors: Hegde, Gurumurthy, Mehdi, Q. Z., Al-Dabbagh, Jinan B., Ahmed, Naser Mahmoud
Format: Article
Language:English
Published: Maney Online Publishing 2014
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Online Access:http://umpir.ump.edu.my/id/eprint/8091/1/Enhancement%20of%20Surface%20Properties%20Using%20New%20Annealing%20Technique%20for%20ITO%20thin%20films.pdf
http://umpir.ump.edu.my/id/eprint/8091/
http://dx.doi.org/10.1179/1743294414Y.0000000369
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Institution: Universiti Malaysia Pahang
Language: English
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spelling my.ump.umpir.80912018-05-17T06:06:57Z http://umpir.ump.edu.my/id/eprint/8091/ Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films Hegde, Gurumurthy Mehdi, Q. Z. Al-Dabbagh, Jinan B. Ahmed, Naser Mahmoud Q Science (General) Influence of new technique of ‘oil thermal annealing (OTA)’ on the nanostructured ITO coated films which improve adhesion strength, electrical conductivity and optical properties (transmittance) is revealed. The X-ray diffraction measurement (XRD) used to investigate the properties of nano structure films when the annealing temperature increases from 150 to 300°C. Surface characteristics of ITO films were investigated by different methods revealed the improvement in their surface properties due to oil thermal annealing treatment in comparison with as deposited films. Annealing is used to reduce inherent defects that may be introduced during the prepared thin film and cooling processes. The ITO film significantly presents a higher electrical conductivity of 38·6×103 Ω−1 cm−1, as compared with as deposited films (∼0·909×103 Ω−1 cm−1). The proposed technique is useful in photonic device applications. Maney Online Publishing 2014-09-17 Article PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/8091/1/Enhancement%20of%20Surface%20Properties%20Using%20New%20Annealing%20Technique%20for%20ITO%20thin%20films.pdf Hegde, Gurumurthy and Mehdi, Q. Z. and Al-Dabbagh, Jinan B. and Ahmed, Naser Mahmoud (2014) Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films. Surface Engineering. ISSN 0267-0844 (print); 1743-2944 (online) http://dx.doi.org/10.1179/1743294414Y.0000000369 DOI: 10.1179/1743294414Y.0000000369
institution Universiti Malaysia Pahang
building UMP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Pahang
content_source UMP Institutional Repository
url_provider http://umpir.ump.edu.my/
language English
topic Q Science (General)
spellingShingle Q Science (General)
Hegde, Gurumurthy
Mehdi, Q. Z.
Al-Dabbagh, Jinan B.
Ahmed, Naser Mahmoud
Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
description Influence of new technique of ‘oil thermal annealing (OTA)’ on the nanostructured ITO coated films which improve adhesion strength, electrical conductivity and optical properties (transmittance) is revealed. The X-ray diffraction measurement (XRD) used to investigate the properties of nano structure films when the annealing temperature increases from 150 to 300°C. Surface characteristics of ITO films were investigated by different methods revealed the improvement in their surface properties due to oil thermal annealing treatment in comparison with as deposited films. Annealing is used to reduce inherent defects that may be introduced during the prepared thin film and cooling processes. The ITO film significantly presents a higher electrical conductivity of 38·6×103 Ω−1 cm−1, as compared with as deposited films (∼0·909×103 Ω−1 cm−1). The proposed technique is useful in photonic device applications.
format Article
author Hegde, Gurumurthy
Mehdi, Q. Z.
Al-Dabbagh, Jinan B.
Ahmed, Naser Mahmoud
author_facet Hegde, Gurumurthy
Mehdi, Q. Z.
Al-Dabbagh, Jinan B.
Ahmed, Naser Mahmoud
author_sort Hegde, Gurumurthy
title Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
title_short Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
title_full Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
title_fullStr Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
title_full_unstemmed Enhancement of Surface Properties Using New Annealing Technique for ITO Thin Films
title_sort enhancement of surface properties using new annealing technique for ito thin films
publisher Maney Online Publishing
publishDate 2014
url http://umpir.ump.edu.my/id/eprint/8091/1/Enhancement%20of%20Surface%20Properties%20Using%20New%20Annealing%20Technique%20for%20ITO%20thin%20films.pdf
http://umpir.ump.edu.my/id/eprint/8091/
http://dx.doi.org/10.1179/1743294414Y.0000000369
_version_ 1643665789562126336