XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys
International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia.
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Universiti Malaysia Perlis
2010
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my.unimap-101572010-11-01T09:29:15Z XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys Yushamdan, Yusof Muslim, A. Abid Ng, Sha Shiong Haslan, Abu Hassan Zainuriah, Hassan yushamdan@notes.usm.my muslim_abid@yahoo.com shashiong@usm.my haslan@usm.my zai@usm.my III-nitrides Ternary alloy X-ray diffraction (XRD) InGaN International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia. We present the structural properties of ternary InxGa1-xN (0.20 x 0.80) alloys grown on sapphire substrate by plasma-assisted molecular beam epitaxy. High resolution X-ray diffraction (HR-XRD) analyses were used to investigate the phase and crystalline quality of ternary InxGa1-xN. From the XRD phase analysis, it is confirmed that the films InxGa1-xN had wurtzite structure and without any phase separation. In addition, it is found that the Bragg angle of the (0002) InxGa1-xN peak gradually decreases as the In compositions increases, indicating the increases in the lattice constant c of the InxGa1-xN ternary alloys. Apart from that, the composition of InxGa1-xN epilayers is determined by applying the Vegard’s law. Finally, the variation of the crystalline quality as a function of In composition is investigated through the XRD rocking curve analyses. 2010-11-01T09:29:15Z 2010-11-01T09:29:15Z 2010-06-09 Article p.341-343 978-967-5760-02-0 http://hdl.handle.net/123456789/10157 en Proceedings of the International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) 2010 Universiti Malaysia Perlis School of Materials Engineering & School of Environmental Engineering |
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III-nitrides Ternary alloy X-ray diffraction (XRD) InGaN International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) |
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III-nitrides Ternary alloy X-ray diffraction (XRD) InGaN International Conference on X-Rays & Related Techniques in Research & Industry (ICXRI) Yushamdan, Yusof Muslim, A. Abid Ng, Sha Shiong Haslan, Abu Hassan Zainuriah, Hassan XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
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International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2010) jointly organized by Universiti Malaysia Perlis (UniMAP) and X-Ray Application Malaysia Society (XAPP), 9th - 10th June 2010 at Aseania Resort Langkawi, Malaysia. |
| author2 |
yushamdan@notes.usm.my |
| author_facet |
yushamdan@notes.usm.my Yushamdan, Yusof Muslim, A. Abid Ng, Sha Shiong Haslan, Abu Hassan Zainuriah, Hassan |
| format |
Article |
| author |
Yushamdan, Yusof Muslim, A. Abid Ng, Sha Shiong Haslan, Abu Hassan Zainuriah, Hassan |
| author_sort |
Yushamdan, Yusof |
| title |
XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
| title_short |
XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
| title_full |
XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
| title_fullStr |
XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
| title_full_unstemmed |
XRD analyses of InxGa1-xN (0.20 x 0.80) ternary alloys |
| title_sort |
xrd analyses of inxga1-xn (0.20 x 0.80) ternary alloys |
| publisher |
Universiti Malaysia Perlis |
| publishDate |
2010 |
| url |
http://dspace.unimap.edu.my/xmlui/handle/123456789/10157 |
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1643789696620298240 |