Homogeneous surface metrology using structured fringe projection
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2014
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my.unimap-334872014-04-08T07:53:03Z Homogeneous surface metrology using structured fringe projection Sundaraj, Kenneth, Prof. Dr. Retnasamy, V kenneth@unimap.edu.my Automated visual inspection (AVI) Fringe projection Non-collimated lighting Link to publisher's homepage at http://www.wseas.org/ Automated visual inspection (AVI) systems are playing important roles in quality inspection within the electronic industry. Most existing AVIs are single overhead cameras. Such systems are incapable of detecting 3D surface defects. This paper proposes to solve this shortcoming using an angled fringe projection. Within this context, existing implementations use multiple images of shifted fringe patterns and then apply phase unwrapping techniques to obtain the phase angle which is then used to compute the height. In our work, we use a single captured image and a direct triangulation technique. With proper image processing, this method can be applied to homogeneous surfaces after proper calibration. Our work demonstrates the successful manipulation and calibration of a non-collimated light source for height measurement. 2014-04-08T03:27:08Z 2014-04-08T03:27:08Z 2008 Article Computers and simulation in modern science, vol. 1, 2008, pages 71-75 978-960-474-010-9 1790-2769 http://dspace.unimap.edu.my:80/dspace/handle/123456789/33487 http://www.wseas.us/e-library/conferences/2008/tomos/tomos/tomos12.pdf en World Scientific and Engineering Academy and Society |
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Automated visual inspection (AVI) Fringe projection Non-collimated lighting |
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Automated visual inspection (AVI) Fringe projection Non-collimated lighting Sundaraj, Kenneth, Prof. Dr. Retnasamy, V Homogeneous surface metrology using structured fringe projection |
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Link to publisher's homepage at http://www.wseas.org/ |
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kenneth@unimap.edu.my |
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kenneth@unimap.edu.my Sundaraj, Kenneth, Prof. Dr. Retnasamy, V |
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Sundaraj, Kenneth, Prof. Dr. Retnasamy, V |
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Sundaraj, Kenneth, Prof. Dr. |
title |
Homogeneous surface metrology using structured fringe projection |
title_short |
Homogeneous surface metrology using structured fringe projection |
title_full |
Homogeneous surface metrology using structured fringe projection |
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Homogeneous surface metrology using structured fringe projection |
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Homogeneous surface metrology using structured fringe projection |
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homogeneous surface metrology using structured fringe projection |
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World Scientific and Engineering Academy and Society |
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2014 |
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http://dspace.unimap.edu.my:80/dspace/handle/123456789/33487 |
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