Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating
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MASS Malaysia
2014
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my.unimap-355542014-06-16T03:43:58Z Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating Dewi Suriyani, Che Halin, Dr. Ibrahim, Abu Talib, Prof. Dr. Muhammad Azmi, Abd Hamid Abdul Razak, Daud dewisuriyani@unimap.edu.my ibatal@ukm.my azmi@ukm.my ard@ukm.my Cuprous oxide Sol-gel n-Si Thin films Scanning electron microscopy (SEM) Link to publisher's homepage at http://my.masshp.net/ Cuprous oxide films were successfully grown onto a n-Si substrate with (100) orientation via sol-gel spin-coating method at room temperature in air followed by annealing in 5% H2 + 95% N2 atmosphere. The annealed temperatures were varied between 350-550 ºC. The crystallinity and morphology of the oxide thin films were studied by grazing angle X-ray diffractometer (GAXRD) and scanning electron microscopy (SEM), respectively. GAXRD indicated that the crystallinity of the films increased with higher annealing temperature. SEM images revealed that the Cu2O films form irregular grain size instead of smooth film which indicated the film growth followed Volmer-Weber growth mode. The size and shape of cuprous oxide grains also changed with temperature. Irregular shape with average size of 100 nm can be seen at annealed temperature 350 ºC which evolved into rectangular like shape with average size of 200 nm at annealed temperature 550 ºC. Optical reflectance revealed similar pattern for each film at wavelengths below 480 nm. It is believed that the absorption is due to energy gap of Cu2O. The maximum reflectance for each film also varies which may be due to different coverage and size of the grains. 2014-06-16T03:43:58Z 2014-06-16T03:43:58Z 2008 Article Solid State Science and Technology, vol. 16(1), 2008, pages 232-237 0128-7389 http://journal.masshp.net/volume-16-no-1-2008/ http://dspace.unimap.edu.my:80/dspace/handle/123456789/35554 en MASS Malaysia |
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Cuprous oxide Sol-gel n-Si Thin films Scanning electron microscopy (SEM) |
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Cuprous oxide Sol-gel n-Si Thin films Scanning electron microscopy (SEM) Dewi Suriyani, Che Halin, Dr. Ibrahim, Abu Talib, Prof. Dr. Muhammad Azmi, Abd Hamid Abdul Razak, Daud Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
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dewisuriyani@unimap.edu.my |
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dewisuriyani@unimap.edu.my Dewi Suriyani, Che Halin, Dr. Ibrahim, Abu Talib, Prof. Dr. Muhammad Azmi, Abd Hamid Abdul Razak, Daud |
| format |
Article |
| author |
Dewi Suriyani, Che Halin, Dr. Ibrahim, Abu Talib, Prof. Dr. Muhammad Azmi, Abd Hamid Abdul Razak, Daud |
| author_sort |
Dewi Suriyani, Che Halin, Dr. |
| title |
Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
| title_short |
Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
| title_full |
Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
| title_fullStr |
Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
| title_full_unstemmed |
Characterization of cuprous oxide thin films on n-Si substrate prepared by sol-gel spin coating |
| title_sort |
characterization of cuprous oxide thin films on n-si substrate prepared by sol-gel spin coating |
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MASS Malaysia |
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2014 |
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http://dspace.unimap.edu.my:80/dspace/handle/123456789/35554 |
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