Degradation of single layer MEH-PPV organic light emitting diode (OLED)

Link to publisher's homepage at http://ieeexplore.ieee.org

Saved in:

Bibliographic Details
Main Authors:	Nurjuliana, Juhari, Wan Haliza, Abd. Majid, Zainol Abidin, Ibrahim
Format:	Article
Language:	English
Published:	Institute of Electrical and Electronics Engineering (IEEE) 2009
Subjects:	Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/6683
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Universiti Malaysia Perlis
Language:	English

id	my.unimap-6683
record_format	dspace
spelling	my.unimap-66832010-11-23T05:11:09Z Degradation of single layer MEH-PPV organic light emitting diode (OLED) Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors Link to publisher's homepage at http://ieeexplore.ieee.org The degradation process of a single layer electroluminescence (EL) polymer MEH-PPV organic light emitting diode (OLED) with the MEH-PPV thickness of 57plusmn3 nm is discussed. Typical structure of OLED fabrication is Al/MEH-PPV/ITO (indium tin oxide). Electroluminescence (EL) spectrum indicates that the emission of MEH-PPV device is the yellow orange color. The device degrades by days as demonstrated by the increased in the turn on voltage obtained from I/V curves. The scanning electron microscope (SEM) images show some bubbles emerge on the surface of the device after an electric field was applied to it. 2009-08-06T10:09:18Z 2009-08-06T10:09:18Z 2006 Article p.112-115 4266580 http://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4266580 http://hdl.handle.net/123456789/6683 en Proceedings of IEEE International Conference on Semiconductor Electronics (ICSE 2006) Institute of Electrical and Electronics Engineering (IEEE)
institution	Universiti Malaysia Perlis
building	UniMAP Library
collection	Institutional Repository
continent	Asia
country	Malaysia
content_provider	Universiti Malaysia Perlis
content_source	UniMAP Library Digital Repository
url_provider	http://dspace.unimap.edu.my/
language	English
topic	Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors
spellingShingle	Electroluminescences Scanning electron microscopy (SEM) Organic light emitting diodes Light emitting diodes Semiconductors Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim Degradation of single layer MEH-PPV organic light emitting diode (OLED)
description	Link to publisher's homepage at http://ieeexplore.ieee.org
format	Article
author	Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim
author_facet	Nurjuliana, Juhari Wan Haliza, Abd. Majid Zainol Abidin, Ibrahim
author_sort	Nurjuliana, Juhari
title	Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_short	Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_full	Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_fullStr	Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_full_unstemmed	Degradation of single layer MEH-PPV organic light emitting diode (OLED)
title_sort	degradation of single layer meh-ppv organic light emitting diode (oled)
publisher	Institute of Electrical and Electronics Engineering (IEEE)
publishDate	2009
url	http://dspace.unimap.edu.my/xmlui/handle/123456789/6683
_version_	1643788576534560768

Degradation of single layer MEH-PPV organic light emitting diode (OLED)

Similar Items