Feasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive properties

• Main Authors: Zulkifli, Husin, Abdul Hallis, Abdul Aziz, R. Badlishah, Ahmad
• Other Authors: [e-mail]
• Format: Article
• Language: English
• Published: Institute of Electrical and Electronics Engineering (IEEE) 2009
• Subjects: Capacitive and maturity; Dielectric; Agricultural products; Capacitance measurement; Nondestructive testing; Voltage measurement; Fruit maturity
• Online Access: http://dspace.unimap.edu.my/xmlui/handle/123456789/7362
• Institution: Universiti Malaysia Perlis

Link to publisher's homepage at http://ieeexplore.ieee.org