High degree of testability using full scan chain and ATPG-An industrial perspective

High degree of testability using full scan chain and ATPG-An industrial perspective

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Bibliographic Details
Main Authors: Mamun, Ibne Reaz, Lee, W. F., Hamid, N. H., Lo, H. H., Ali Yeon, Mohd Shakaff, Prof. Dr.
Format: Article
Language:English
Published: Asian Network for Scientific Information 2010
Subjects:
Automatic test pattern generation
Design for test
DFT design methodology
Guideline
IC chip packaging
Integrated circuit
Scan chain
Sharing pin for testing
VLSI
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/9170
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Institution: Universiti Malaysia Perlis
Language: English

Internet

http://dspace.unimap.edu.my/xmlui/handle/123456789/9170

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